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Astron. Astrophys. 328, 752-755 (1997) 3. DiscussionA typical P II emission spectrum, acquired with 0.006nm full-width
half-maximum spectral resolution, is shown in Figure 1. The measured
intensity ratio of the
Although the echelle grating gives greatly improved dispersion and resolution over a standard grating, it has the difficulty that many spectral orders overlap. Unwanted orders can be very effectively eliminated with the use of
a pre-monochromator with a suitably narrow bandpass, such as the
Seya-Namioka instrument used here. However, when extremely weak lines
are being observed, as in the present case, a small amount of leakage
from other orders can sometimes be observed. In Figure 1, an off-order
Ar line can be seen on the short wavelength side of the 219.6nm line.
The relative intensity of the Ar line is only about 10% and it is
almost completely resolved from the 219.6nm line. The two lines are
separated by 0.012nm and the spectral resolution is 0.006nm. The line
appearing at 220.7nm is actually a He I line at 318.77nm in
Possible systematic effects at the 5% level and below are difficult to identify. We can say, however, that because of the small transition probabilities of these lines it is certain that radiation trapping does not occur. In addition, both lines originate from a common upper level, so collisional processes do not influence their relative intensities. A check for errors in the radiometric correction is made by changing the position of the lines relative to the pre-monochromator bandpass and to the photodiode array, independently. Although we have used a resolving power of 35,000, there is also the possibility of a weak unresolved blend. Difficulties in calculating parameters such as branching ratios,
fine-structure splitting, and lifetimes for weak inter-system lines
have been noted (Brage 1997, Ellis 1989, Martinson and Ellis 1985).
Several calculations of the Recent ab initio calculations by Brage (1997) have given a
ratio in the range 2.82-2.94 depending on the number of terms mixing
with the No precise measurements for this branching ratio have been made previously. An early laboratory observation by Martin (1959) yielded an estimated ratio of 2.5, with no experimental uncertainty given. Svendinius (1983) observed a ratio of 0.5, but this anomalous result was later shown to be caused by a contaminating P IV line (Smith et al. 1984b). A measurement of the same ratio in iso-electronic S III (the branching ratio is expected to vary slowly along an iso-electronuc sequence) yielded a value of 2.7 (Moos et al. 1983). This latter result is in agreement with Brage's (1997) calculations for S III. The P II 219.6nm and 221.0nm lines are the only significant decay
branches of the ![]() ![]() ![]() ![]() © European Southern Observatory (ESO) 1997 Online publication: March 26, 1998 ![]() |